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	› BiTS ( Burn-in & Test Socket ) › Connector BU › Semiconductor BU › Precision Technology BU › Display BU

Excellent Test Contact Solutions with high performance spring probes Price Advantage with wide selection of open tools DDR, DDR-II,DDR-III,SDRAM,GDDR,SRAM 60/ 68 / 80 / 84 / 92 / 136 / 144 / 167FBGA Compatible design for currently available handlers Use various spring probe pins for contact Compact design for high density on PC Board Operation cycles over 100K times Both machinig & molding available for housing Designed for tin flake and contact contamination Self-Cleaning by device contact Competitive development cost Designed for high frequency device Excellent desing for Current flow & Cold