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	› BiTS ( Burn-in & Test Socket ) › Connector BU › Semiconductor BU › Precision Technology BU › Display BU

Various test sockets are available per module component designs and outlines. Short contact provides short electrical path. Contacts are designed to work individually to improve warped module handling. Good electrical performance and mechanical reliability found even at Cold test. Module components loading & unloading for test are easy. Both electrical final test and Board level test are supported.